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Air Semiconductor and Dolphin Integration enable next generation GPS solutions

Dolphin Integration, a leading embedded memories supplier, has announced the selection by Air Semiconductor of its latest RAM’s and ROM’s. Until now, the development of GPS applications within portable devices has been limited due to high power consumption. With its breakthrough GPS solution, Air Semiconductor will allow application providers to target portable devices such as […]

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VHDL-AMS models of millimeter-wave oscillators for simulations of system-on-chip behavior
Colloque GDR SOC SIP, Paris (France), 2p. M. Kraemer, D. Dragomirescu, R. Plana

Introduction For future high-data rate communication systems the ultra-large frequency band around 60 GHz represents a promising alternative to the overcrowded spectra available at lower frequencies. To avoid connection losses and achieve small system size and very low cost, the transceivers will typically be designed as System on Chip (SoC) in a low cost silicon

VHDL-AMS models of millimeter-wave oscillators for simulations of system-on-chip behavior
Colloque GDR SOC SIP, Paris (France), 2p. M. Kraemer, D. Dragomirescu, R. Plana
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Keeping the best audio quality in mobile phone by managing voltage drops created by 217 Hz transients
M.Maurel

Source of major noise Whatever the protocol used by a mobile phone, GSM or TDMA, RF transmitter switching creates the most notorious noise for the power supply. The RF power amplifier switches on and off at a rate of 217 Hz. At each of these events, a high current (up to 1.7A) is drawn from

Keeping the best audio quality in mobile phone by managing voltage drops created by 217 Hz transients
M.Maurel
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Yield prediction in an automotive MEMS application with help of statistical analysis packages SAE J2748
4. ASIM Workshop, Wismar, ISBN 9783901608339, P. 251-256
D.Dammers, D.Schollän, L.M.Voßkämper

Abstract This paper shows a methodology for the yield prediction of Micro Electro Mechanical Systems (MEMS). Variations of process properties during the production of MEMS are considered in system simulations. Yield prediction based on the distribution functions provided by statistical analysis packages SAE J2748 is demonstrated on a capacity based accelerometer system… Download this press

Yield prediction in an automotive MEMS application with help of statistical analysis packages SAE J2748
4. ASIM Workshop, Wismar, ISBN 9783901608339, P. 251-256
D.Dammers, D.Schollän, L.M.Voßkämper
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Calibration in a MEMS based measurement system or how to make a sensor-ASIC loop of high resolution work
Smart system Integration, Barcelona, Spain, T. Gessner (Ed.) VDE Verlag, ISBN 9783800730810, P.546-549
L.M.Voßkaemper, C.Domingues, L.Engels

Micro-Electro-Mechanical Systems (MEMS) as inertial sensors, like accelerometers and gyroscopes, are finally becoming attractive for many industrial applications, and their potential range of use is about to explode in the coming years. The application trend towards high resolution, reliability, and miniaturization, pushes system integrators to combine both the inertial sensor and its application-specific integrated circuit

Calibration in a MEMS based measurement system or how to make a sensor-ASIC loop of high resolution work
Smart system Integration, Barcelona, Spain, T. Gessner (Ed.) VDE Verlag, ISBN 9783800730810, P.546-549
L.M.Voßkaemper, C.Domingues, L.Engels
Read More »